Integrated circuit testing arrangement comprises a measuring circuit for measuring operating values of a circuit that are representative of its operation, with an analysis circuit for detecting and evaluating voltage level changes

摘要

Circuit arrangement for measuring at least one operating value of an integrated circuit comprises an analysis circuit (2) that is connected to at least one external connection (P0-P2) of the integrated circuit. The analysis circuit detects several voltage level changes (V1, V2) at the external connections and feeds them to a counter circuit (41-71) that records at least one digital coded value (4-7) that is representative of at least one operating value. The arrangement also comprises an output circuit (3) for output of the coded values or values derived therefrom. An Independent claim is made for a method for measuring at least one operating value of an integrated circuit.