首页> 外国专利> Measurement circuit for measuring the operating values, especially voltage, current or power of an IC, has a first circuit for measuring sequential states of a reference signal and a second circuit for measuring a clock signal

Measurement circuit for measuring the operating values, especially voltage, current or power of an IC, has a first circuit for measuring sequential states of a reference signal and a second circuit for measuring a clock signal

机译:用于测量工作值,特别是IC的电压,电流或功率的测量电路具有用于测量参考信号的顺序状态的第一电路和用于测量时钟信号的第二电路

摘要

Circuit for determining at least an electrical value, especially a voltage, current or power value of an integrated circuit during its operation, has: a first measurement unit (5) for measuring and counting of sequential states of a reference signal (Ust) for generating an output voltage (Vint) of a voltage generator circuit (2) of the integrated circuit; a second measurement unit (6) for recording a clock signal (CK) and; an output circuit (7, 8) for output of a counter value of signal states for the reference signal and time reference signal with the aid of determining an electrical value. An Independent claim is made for a method for determining at least an electrical value, especially a voltage, current or power value of an integrated circuit during its operation.
机译:用于至少确定集成电路的电值,尤其是电压,电流或功率值的电路具有:第一测量单元(5),用于测量和计数参考信号(Ust)的顺序状态以产生集成电路的电压发生器电路(2)的输出电压(Vint);第二测量单元(6),用于记录时钟信号(CK);以及输出电路(7、8),用于通过确定电值来输出参考信号和时间参考信号的信号状态的计数值。提出了一种用于至少确定集成电路的电值,尤其是集成电路的电压,电流或功率值的方法的独立权利要求。

著录项

  • 公开/公告号DE10255665A1

    专利类型

  • 公开/公告日2004-06-24

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2002155665

  • 发明设计人 PERNER MARTIN;

    申请日2002-11-28

  • 分类号G01R31/28;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:42

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号