Die testing system for integrated circuit, compares original data from write registers and read data received from the dies of semiconductor wafer and generates test result of die

摘要

The write registers (102,104,106) write original data onto the dies (114) of a semiconductor wafer. A comparator compares original data from the write registers and the read data received from the die, to generate test result of the die. An Independent claim is also included for die testing method.