One time programmable memory cell evaluating method for semiconductor chip, involves producing signal indicating undetermined programming state when electrical characteristic lies between two threshold values

摘要

The method involves determining an electrical characteristic of a cell. The determined characteristic is compared with a threshold value (A) and a threshold value (B). A signal that indicates an undetermined programming state is produced when the characteristic lies between the two threshold values. The cell is programmed so that the characteristic lies outside the interval lying between the two threshold values. An independent claim is also included for a device for evaluating a one time programmable memory cell.