首页> 外国专利> Programming method for flash memory element involves sequentially programming selected memory cells until threshold voltage is reached that is lower than target threshold voltage

Programming method for flash memory element involves sequentially programming selected memory cells until threshold voltage is reached that is lower than target threshold voltage

机译:闪存元件的编程方法包括顺序地对选定的存储单元进行编程,直到达到低于目标阈值电压的阈值电压为止

摘要

The flash memory element programming method involves selecting at least two memory cells in a first step and sequentially programming the selected memory cells in a first time interval in a second step until a first threshold value is reached that is lower than a target threshold voltage. An Independent claim is also included for a flash memory element.
机译:闪存元件编程方法包括在第一步骤中选择至少两个存储单元,并在第二步骤中在第一时间间隔中顺序地编程所选择的存储单元,直到达到低于目标阈值电压的第一阈值为止。闪存元件也包括独立权利要求。

著录项

  • 公开/公告号DE10034743A1

    专利类型

  • 公开/公告日2001-02-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE2000134743

  • 发明设计人 LEE DOO-SUP;

    申请日2000-07-18

  • 分类号G11C16/10;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:43

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