首页> 外国专利> GRAY SCALE MASK, METHOD FOR MANUFACTURING OPTICAL DEVICE, METHOD FOR MANUFACTURING SUBSTRATE AND METHOD FOR MANUFACTURING GRAY SCALE MASK

GRAY SCALE MASK, METHOD FOR MANUFACTURING OPTICAL DEVICE, METHOD FOR MANUFACTURING SUBSTRATE AND METHOD FOR MANUFACTURING GRAY SCALE MASK

机译:灰度掩模,制造光学器件的方法,制造衬底的方法和制造灰度掩模的方法

摘要

PROBLEM TO BE SOLVED: To provide a high accuracy gray scale mask having transmittance approximate to a designed value.;SOLUTION: The gray scale mask is produced by forming a fine pattern on a reticle, reducing and transferring the pattern onto a wafer whose surface is coated with a resist by exposure by using an exposure transfer apparatus, developing the resist and etching the wafer by using the remaining resist as a mask. The distance S between the fine patterns is controlled to be ≥0.3 λ/NA, wherein NA is the numerical aperture of the exposure apparatus and λ is the wavelength of the light used for exposure.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供透射率接近设计值的高精度灰度掩模;解决方案:灰度掩模是通过在掩模版上形成精细图案,将图案缩小并转移到表面为圆片的晶片上而制成的。通过使用曝光转移设备通过曝光涂覆抗蚀剂,显影抗蚀剂并通过使用剩余的抗蚀剂作为掩模来蚀刻晶片。精细图案之间的距离S被控制为≥0.3λ/ NA,其中,NA是曝光设备的数值孔径,而λ是λ。是用于曝光的光的波长。;版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005189371A

    专利类型

  • 公开/公告日2005-07-14

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20030428696

  • 申请日2003-12-25

  • 分类号G03F1/08;

  • 国家 JP

  • 入库时间 2022-08-21 22:35:45

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