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METHOD AND APPARATUS FOR MEASURING PHYSICAL PROPERTIES OF LIQUID CRYSTALLINE MATERIAL

机译:测量液晶材料物理性质的方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a method for measuring physical properties (especially, elastic constant ratio and anchoring energy) of a liquid crystalline material used for the liquid crystal cell of a liquid crystal display device and an optical compensation sheet and the like, and to provide an apparatus therefor.;SOLUTION: The method determines the elastic constant ratios of liquid crystalline materials and the anchoring energy on the interface, on the basis of the elastic continuum theory for a liquid crystalline material, from the pretilt angle of the liquid crystalline material at the vertical alignment interface of a plurality of hybrid aligned liquid crystal cells having different cell gaps, the pretilt angle of the liquid crystalline material on the horizontal alignment interface, and a cell gap value. The apparatus is used in the method for measuring the physical properties of the liquid crystalline material.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种测量用于液晶显示装置的液晶单元和光学补偿片等的液晶材料的物理性质(特别是弹性常数比和锚定能)的方法,以及解决方案:该方法基于液晶材料的弹性连续体理论,从液晶的预倾角确定液晶材料的弹性常数比和界面上的锚定能。在具有不同的单元间隙的多个混合取向的液晶单元的垂直取向界面处的液晶材料,液晶材料在水平取向界面上的预倾角和单元间隙值。该装置用于测量液晶材料的物理性质的方法。;版权所有:(C)2005,日本特许会计师事务所

著录项

  • 公开/公告号JP2005106689A

    专利类型

  • 公开/公告日2005-04-21

    原文格式PDF

  • 申请/专利权人 FUJI PHOTO FILM CO LTD;UCHIDA TATSUO;

    申请/专利号JP20030341871

  • 发明设计人 WATABE ATSUSHI;UCHIDA TATSUO;

    申请日2003-09-30

  • 分类号G01M11/00;G02F1/13;

  • 国家 JP

  • 入库时间 2022-08-21 22:31:14

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