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INTEGRATION OF HIGH PERFORMANCE COPPER INDUCTOR WITH BOND PAD

机译:高性能铜电感与键合片的集成

摘要

PPROBLEM TO BE SOLVED: To integrate high performance copper inductors with global interconnects, and with either Al bond pads or Cu bond pads. PSOLUTION: The integration of high performance copper inductors are conducted wherein a tall, Cu laminate spiral inductor is formed at the last metal level, and at the last metal + 1 level, with the metal levels interconnected by a bar via having the same spiral shape as the spiral metal inductors at the last metal level and the last metal + 1 level. The invention provides methods for integrating the formation of thick inductors with the formation of bond pads, terminals and interconnect wiring with the last metal + 1 wiring. The subject invention uses the dielectric deposition, spacer formation, and/or selective deposition of a passivating metal such as CoWP, to passivate a Cu inductor that is formed after the last metal layer. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:

要解决的问题:将高性能铜电感器与全局互连以及Al键合焊盘或Cu键合焊盘集成在一起。

解决方案:进行高性能铜电感器的集成,其中在最后一个金属层和最后一个金属+ 1层上形成一个高的Cu叠层螺旋电感器,金属层之间通过一条条形孔相互连接,与末级金属和末级金属+1级的螺旋金属电感器具有相同的螺旋形状。本发明提供了用于将厚电感器的形成与接合焊盘,端子和具有最后金属+1布线的互连布线的形成集成的方法。本发明使用诸如CoWP的钝化金属的电介质沉积,间隔物形成和/或选择性沉积来钝化在最后的金属层之后形成的Cu电感器。

版权:(C)2005,JPO&NCIPI

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