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Performance evaluation method of the plasma processing apparatus, maintenance procedures, performance management system, and performance verification system, and plasma processing apparatus

机译:等离子处理装置的性能评估方法,维护程序,性能管理系统和性能验证系统以及等离子处理装置

摘要

PROBLEM TO BE SOLVED: To evaluate simply and promptly whether a requested performance is maintained or not when a plasma treatment device is decomposed and rebuilt after carrying.;SOLUTION: A plurality of plasma treatment chamber units 75, 76, 77, 95, 96, 97 having electrodes 4 and 8, a high-frequency power supply 1 connected to the electrode 4, a matching circuit 2A to gain an impedance alignment with the plasma treatment chamber units 75, 76, 77, 95, 96, 97 and the high-frequency power supply 1, are equipped. Difference |ΔRA||ΔRB| between an input terminal side AC resistance RA and an output terminal side AC resistance RB at a time t0 and a time afterwards t1 is maintained at a smaller value than a given value.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:携带后分解并重建等离子处理设备时,可以简单,迅速地评估是否维持要求的性能;解决方案:多个等离子处理室单元75、76、77、95、96,具有电极4和8的97,与电极4连接的高频电源1,与等离子体处理室单元75、76、77、95、96、97和高阻抗的匹配电路2A进行阻抗对准配备了变频电源1。差异|& RA||& RB|在时间t0和之后的时间t1的输入端子侧交流电阻RA和输出端子侧交流电阻RB之间保持小于给定值的值;版权:(C)2002,JPO

著录项

  • 公开/公告号JP3670209B2

    专利类型

  • 公开/公告日2005-07-13

    原文格式PDF

  • 申请/专利权人 アルプス電気株式会社;大見 忠弘;

    申请/专利号JP20000346793

  • 发明设计人 仲野 陽;大見 忠弘;

    申请日2000-11-14

  • 分类号H05H1/46;B01J19/08;C23C16/509;H01L21/203;H01L21/205;H01L21/3065;H01L21/31;

  • 国家 JP

  • 入库时间 2022-08-21 22:29:13

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