首页> 外国专利> Apparatus and method using the resolution enhancement characteristics for the conversion accuracy of the chemical mechanical polishing pressure required for the force applied to the wafer by the polishing head

Apparatus and method using the resolution enhancement characteristics for the conversion accuracy of the chemical mechanical polishing pressure required for the force applied to the wafer by the polishing head

机译:使用分辨率增强特性的设备和方法,用于由抛光头施加到晶片的力所需的化学机械抛光压力的转换精度

摘要

And methods CMP system to move relative to the retainer ring and the wafer, for CMP process A1 A polishing pad, to execute the instructions to add required pressure on the wafer. Pressure calculation, and the accuracy of the conversion to the force from the pressure is enhanced without the use of high-resolution components such as high-resolution digital device. Using the process both analog and digital, accuracy is improved in this way, the unit of the first set and also to the unit of the second set of units of the first set value of the requested power, or required pressure, It is realized by converting it to return. Quantization process is performed using the data processed by the average resolution of the digital device. In order to obtain the calculated value of the pressure and force have acceptable accuracy, a process of transmitting both the pressure / force set point data and the scale of the pressure / force between processing different devices, the process, as a result , and obtains a significantly reduced quantization error or eliminated.
机译:和方法CMP系统相对于固定环和晶片运动,用于CMP过程A1 A抛光垫,执行指令以在晶片上增加所需压力。无需使用高分辨率组件(例如高分辨率数字设备),就可以提高压力计算以及从压力转换为力的准确性。通过使用模拟和数字过程,以这种方式提高了精度,即第一组的单位以及第二组的第二单位的要求功率或要求压力的第一设定值的单位。将其转换为返回。使用由数字设备的平均分辨率处理的数据执行量化过程。为了获得具有可接受的精度的压力和力的计算值,在处理不同设备之间传输压力/力设定点数据和压力/力的标度的过程,结果得到大大减少或消除了量化误差。

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