首页> 外国专利> With the separable insulating formation burial on land in the hole of the converse T letter condition which

With the separable insulating formation burial on land in the hole of the converse T letter condition which

机译:与可分离的绝缘地层埋在陆上的反T字孔中

摘要

A semiconductor device having a silicon-on-insulator (SOI) structure includes a lower silicon substrate and an upper silicon pattern electrically insulated from the lower silicon pattern by an isolating insulation layer buried by a reverse T-type hole formed in the lower silicon substrate. A gate insulation layer and a gate electrode are formed over the upper silicon pattern, and source/drain regions are formed in the upper silicon pattern centered around the gate electrode. Also, a channel region is disposed between the source/drain region. A silicon layer or a porous silicon layer is formed under the channel region for electrically connecting the lower silicon substrate and the upper silicon pattern. A body contact, which is the same as that of a general semiconductor device, is thus allowed without a special change in the design of the semiconductor device.
机译:具有绝缘体上硅(SOI)结构的半导体器件包括下部硅基板和通过被形成在下部硅基板中的反向T型孔掩埋的隔离绝缘层而与下部硅图形电绝缘的上部硅图形。 。在上部硅图案上方形成栅绝缘层和栅电极,并且在以栅电极为中心的上部硅图案中形成源/漏区。此外,沟道区设置在源/漏区之间。在沟道区域下方形成硅层或多孔硅层,以电连接下硅基板和上硅图案。因此,无需对半导体器件的设计进行特别的改变就可以实现与一般的半导体器件相同的体接触。

著录项

  • 公开/公告号JP3678641B2

    专利类型

  • 公开/公告日2005-08-03

    原文格式PDF

  • 申请/专利权人 三星電子株式会社;

    申请/专利号JP20000311209

  • 发明设计人 ▲ベ▼ 金鐘;

    申请日2000-10-11

  • 分类号H01L29/78;H01L21/76;H01L21/764;H01L27/08;H01L27/12;H01L29/786;

  • 国家 JP

  • 入库时间 2022-08-21 22:27:34

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