首页> 外国专利> Underfill for maximum flip chip package reliability

Underfill for maximum flip chip package reliability

机译:底部填充,最大程度提高倒装芯片封装的可靠性

摘要

An electronic package is disclosed with an underfill with multiple areas of different stiffness and a method of constructing same. An underfill shell region that contacts the chip and the substrate is stiffer than an underfill build region that does not contact either the chip or the substrate. The variation in stiffness may be achieved using materials in the shell that include more filler and/or less solvents than the materials in the bulk region. The underfill may also be composed of a single material with an adhesion to the chip and substrate that is stronger than the material's internal cohesion (e.g., a long chain polymer with an active carboxyl group at the end of the chain). This can be achieved by exposing the chip and substrate surfaces to a curing substance (e.g., vaporized hydrofluoric acid).
机译:公开了一种具有底部填充物的电子封装,该底部填充物具有多个具有不同刚度的区域,并且其构造方法也是如此。接触芯片和衬底的底部填充壳区域比不接触芯片或衬底的底部填充构建区域更硬。刚性的变化可以通过使用壳体中的材料来实现,该材料比主体区域中的材料包括更多的填充剂和/或更少的溶剂。底部填充物也可以由对芯片和基板的粘合力强于该材料的内部粘合力的单一材料构成(例如,在链末端具有活性羧基的长链聚合物)。这可以通过使芯片和衬底表面暴露于固化物质(例如汽化氢氟酸)中来实现。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号