首页> 外国专利> Permanently on transistor implemented using a double polysilicon layer CMOS process with buried contact

Permanently on transistor implemented using a double polysilicon layer CMOS process with buried contact

机译:永久在使用具有埋入式接触的双多晶硅层CMOS工艺实现的晶体管上

摘要

A permanently-ON MOS transistor comprises silicon source and drain regions of a first conductivity type in a silicon well region of a second conductivity type. A silicon contact region of the first conductivity types is buried in the well region, said contact region contacting said source region and said drain region. A first gate insulating layer is selectively placed over the silicon source and drain regions. A second gate insulating layer is selectively placed over the first gate insulating layer and over the silicon contact region. A polysilicon gate region is placed over the second gate insulating layer.
机译:永久导通的MOS晶体管包括在第二导电类型的硅阱区中的第一导电类型的硅源极和漏极区。第一导电类型的硅接触区埋在阱区中,所述接触区接触所述源极区和所述漏极区。第一栅极绝缘层被选择性地放置在硅源极区和漏极区上方。第二栅极绝缘层被选择性地放置在第一栅极绝缘层之上和硅接触区域之上。在第二栅极绝缘层上方放置多晶硅栅极区域。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号