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Micro connector to facilitate testing of micro electronic component and subassemblies
Micro connector to facilitate testing of micro electronic component and subassemblies
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机译:微型连接器,方便测试微型电子元件和组件
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摘要
The present invention is a testing apparatus which includes a contact connector comprised of a housing with contact blades extending from the housing. The contact blades are pivotally mounted to the housing by pivot rods. A biasing element is coupled to the contact blades, providing resistance against rotary movement of the contact blade in one direction. In one embodiment, the housing has a comb structure including a plurality of slots and slot division walls between the slots. A spacer is disposed in each of the slots, and the contact blades are aligned with the slot division walls.
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