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Device for scanning acoustic emission signals and parametric quantities of non-encapsulated electronic components
Device for scanning acoustic emission signals and parametric quantities of non-encapsulated electronic components
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机译:扫描声发射信号和未封装电子部件的参量的装置
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摘要
In the present invention, there is disclosed a device intended for scanning acoustic emission signals when monitoring aging process û degradation, seasoning inclusive of optional structural changes all over the course thereof from the start up to the seasoning process end, of the encapsulated electronic components. The invented acoustic emission method is characterized by detection elastic stress waves using a piezoelectric transducer. The monitored elastic stress waves occur in an electronic component because of abrupt accumulation of energy due to discrete movement changes.
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