DEVICE FOR DETERMINING THE THICKNESS AND GROWTH SPEED OF AN ICE LAYER

摘要

The invention relates to a method and a device for determining the thickness and formation rate of a layer of ice on components, in particular on aircraft components. According to the invention, the radiation which falls on a surface covered with an ice layer and/or a disruptive layer (1) is spectrally split by a holographic optical diffraction grating (6), connected to a line-scanning receiver (7). By comparing the measured radiation with a stored reflection curve of a surface without any deposit and by linking the comparison values and the determination of the peak surface in the wavelength range of the ice absorption, a correction to said ice absorption is obtained and the thickness and formation rate of the ice and/or disruptive layer (1) is determined and displayed. The device provides a window (3) in the surface which is covered by an ice and/or disruptive layer (1). Radiation passes through said window by means of an optical representation system (4) and an entry gap (5) and falls onto a holographic optical diffraction grating (6), where it is split according to wavelength, represented in a line-scanning receiver (7) and evaluated, using a control and evaluation unit (8). The evaluation data is displayed on a display (9).