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ELECTRONIC PACKAGE RELIABILITY PREDICTION SYSTEM AND ELECTRONIC PACKAGE RELIABILITY PREDICTION PROGRAM

机译:电子包装可靠性预测系统和电子包装可靠性预测程序

摘要

An electronic package reliability prediction system is provided with a database having data of shapes, modeling specifications and material characteristics of an electronic package, a parameter setting part, to which the types, sizes, material selection and evaluating conditions of the electronic package are inputted, a modeling part, which generates a simulation model based on the material characteristic data and the size parameters of a material specified by the inputted parameters, a simulation executing part, which performs simulation under the specified conditions based on the simulation model, a simulation result evaluating part, which evaluates the simulation results in the prescribed evaluating conditions and accumulates the evaluation results in an evaluation result database, an evaluation expression generating part, which generates an approximate expression of the evaluation results for the inputted parameters to obtain an evaluation expression, for the simulation to which a plurality of evaluation results are accumulated, and an evaluation predicting part for outputting evaluation prediction results by the evaluation expression for the electronic package whose evaluation expression has been already constructed.
机译:电子封装件可靠性预测系统具有数据库,该数据库具有电子封装件的形状,建模规格和材料特性的数据,参数设置部件,向该参数设置部件输入电子封装件的类型,尺寸,材料选择和评估条件,建模部,其基于材料特性数据和由输入的参数指定的材料的尺寸参数生成仿真模型;仿真执行部,基于仿真模型在指定条件下执行仿真,仿真结果评估评估表达式生成部分,其在规定的评估条件下评估模拟结果,并将评估结果累积在评估结果数据库中;评估表达式生成部分,针对输入的参数生成评估结果的近似表达式,以获得评估表达式。模拟到哪个累积多个评估结果,并且评估预测部分用于通过针对已经构造了评估表达式的电子封装的评估表达式来输出评估预测结果。

著录项

  • 公开/公告号WO2005088483A1

    专利类型

  • 公开/公告日2005-09-22

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;SAKAI HIDEHISA;

    申请/专利号WO2005JP01782

  • 发明设计人 SAKAI HIDEHISA;

    申请日2005-02-07

  • 分类号G06F17/50;

  • 国家 WO

  • 入库时间 2022-08-21 22:08:37

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