首页> 外国专利> APPARATUS AND METHOD FOR SUPPLYING PLENTY OF GAS FOR UNIFORM HEAT PROCESS OF SEMICONDUCTOR WAFER TO IMPROVE YIELD OF WAFER

APPARATUS AND METHOD FOR SUPPLYING PLENTY OF GAS FOR UNIFORM HEAT PROCESS OF SEMICONDUCTOR WAFER TO IMPROVE YIELD OF WAFER

机译:为半导体晶片的均匀加热过程供应大量气体以提高晶片产率的设备和方法

摘要

PURPOSE: An apparatus for supplying plenty of gas for a uniform heat process of a semiconductor wafer is provided to make the thickness of a dielectric formed on the wafer uniform and to improve yield of the wafer by supplying process gas of uniform temperature and pressure to the center of the wafer from the outer circumference of the wafer. CONSTITUTION: Gas is supplied to a connection block(110) closely attached to a gas supply unit of a chamber in which an RTP(rapid thermal process) is performed on the wafer. A ring(120) communicates with and is connected to both sides of the connection block while extending as an almost semicircle line type to a gas exhaust hole along the circular inner wall of the chamber. A plurality of supply holes(122) are formed inside the ring to supply preheated gas to the inner circumferential surface of the wafer.
机译:目的:提供一种用于为半导体晶片的均匀热处理提供大量气体的设备,以使形成在晶片上的电介质的厚度均匀,并通过向晶片提供均匀温度和压力的处理气体来提高晶片的成品率。从晶片的外周到晶片的中心。组成:将气体供应到一个连接块(110),该连接块紧密地连接到对晶片进行RTP(快速热处理)的腔室的气体供应单元。环(120)与连接块的两侧连通并连接到连接块的两侧,同时沿腔室的圆形内壁以几乎半圆形的线型延伸到排气孔。多个供应孔(122)形成在环的内部,以将预热的气体供应到晶片的内周表面。

著录项

  • 公开/公告号KR20040096398A

    专利类型

  • 公开/公告日2004-11-16

    原文格式PDF

  • 申请/专利权人 DONGBU ELECTRONICS CO. LTD.;

    申请/专利号KR20030029508

  • 发明设计人 SHIN MUN U;

    申请日2003-05-09

  • 分类号H01L21/324;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:33

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