首页> 外国专利> PLASMA PROCESS APPARATUS AND CONTROL METHOD THEREOF TO AVOID ABNORMAL DISCHARGE IN INITIAL STAGE OF PLASMA PROCESS AND GUARANTEE UNIFORMITY OF PLASMA DURING PLASMA PROCESS

PLASMA PROCESS APPARATUS AND CONTROL METHOD THEREOF TO AVOID ABNORMAL DISCHARGE IN INITIAL STAGE OF PLASMA PROCESS AND GUARANTEE UNIFORMITY OF PLASMA DURING PLASMA PROCESS

机译:避免等离子体过程初始阶段异常放电和等离子体过程中等离子体保证均匀性的等离子体过程装置及其控制方法

摘要

PURPOSE: A plasma process apparatus is provided to avoid an abnormal electric discharge in an initial stage of a plasma process and guarantee uniformity of plasma during the plasma process by applying an overshoot voltage of the second electrode before a plasma treatment is performed on an object to be processed. CONSTITUTION: The first electrode is disposed in a process chamber in which plasma is generated to process an object to be processed. The second electrode is disposed in a position confronting the first electrode in the process chamber. The first power source for supplying the first power to the first electrode belongs to the first power meter. The second power source for supplying the second power to the second electrode belongs to the second power meter. A control unit controls the first power meter and the second power meter. The control unit controls both or either of the first and second power meters so that a prior treatment voltage higher than a voltage applied to the second electrode during a plasma process performed on the object to be processed is applied to the second electrode for a predetermined interval before the plasma process is performed on the object to be processed in the process chamber.
机译:用途:提供一种等离子体处理装置,以避免在等离子体处理的初始阶段出现异常放电,并通过在对物体进行等离子体处理之前施加第二电极的过冲电压来确保等离子体处理期间等离子体的均匀性。被处理。构成:第一电极设置在处理室中,在处理室中产生等离子体以处理要处理的对象。第二电极在处理室中设置在与第一电极相对的位置。用于向第一电极供应第一功率的第一电源属于第一功率计。用于向第二电极供应第二功率的第二电源属于第二功率计。控制单元控制第一功率计和第二功率计。控制单元控制第一电表和第二电表中的任一个或第二电表,以便在预定的时间间隔内向第二电极施加高于在对被处理对象进行等离子体处理期间施加于第二电极的电压的先前处理电压。在处理室中对要处理的对象执行等离子体处理之前。

著录项

  • 公开/公告号KR20040099148A

    专利类型

  • 公开/公告日2004-11-26

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号KR20040034142

  • 发明设计人 KITANO MASATOSHI;KOSHIISHI AKIRA;

    申请日2004-05-14

  • 分类号H01L21/3065;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:28

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