首页> 外国专利> CRYSTALLIZATION METHOD FOR POLYSILICON TFT FOR IMPROVING PROPERTIES OF SEMICONDUCTOR LAYER AND APPARATUS FOR PLANARIZING CRYSTALLIZED POLYSILICON LAYER

CRYSTALLIZATION METHOD FOR POLYSILICON TFT FOR IMPROVING PROPERTIES OF SEMICONDUCTOR LAYER AND APPARATUS FOR PLANARIZING CRYSTALLIZED POLYSILICON LAYER

机译:用于改善半导体层性能的多晶硅TFT的结晶方法以及用于平面化结晶硅层的装置

摘要

Purpose: from the polysilicon layer of crystallization, the polysilicon layer for being used to shakeout a crystallization for the method for crystallising of a polycrystalline SiTFT (thin film transistor) and a device is arranged to improve the prominent cereal of characteristic an of semiconductor layer by removal. Construction: the substrate with a polysilicon layer is loaded (S501). Substrate alignment (S502). Prominent cereal removes from substrate (S503). Substrate is cleaned (S504). Substrate is overthrown (S505). The substrate of reversing is uploaded (S506).
机译:目的:从结晶的多晶硅层中,用于结晶多晶硅薄膜的方法中的用于摇动结晶的多晶硅层和装置被布置成通过改善硅层的特性来突出谷物。去除。构造:装载具有多晶硅层的衬底(S501)。基板对准(S502)。突出的谷物从基质上去除(S503)。基板被清洁(S504)。基板被推倒(S505)。反转基板被上载(S506)。

著录项

  • 公开/公告号KR20050000757A

    专利类型

  • 公开/公告日2005-01-06

    原文格式PDF

  • 申请/专利权人 LG.PHILIPS LCD CO. LTD.;

    申请/专利号KR20030041263

  • 发明设计人 YOON IN SOO;

    申请日2003-06-24

  • 分类号H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:07

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