首页> 外国专利> METHOD OF FABRICATING LANDING PLUG TO SECURE BOTTOM AREA OF CONTACT HOLE AND IMPROVE CONTACT RESISTANCE

METHOD OF FABRICATING LANDING PLUG TO SECURE BOTTOM AREA OF CONTACT HOLE AND IMPROVE CONTACT RESISTANCE

机译:制造登陆塞以确保接触孔底部区域并提高接触阻力的方法

摘要

PURPOSE: A method of fabricating a landing plug is provided to improve a contact resistance characteristic by securing a bottom area of a contact hole by a cleaning process. CONSTITUTION: A conductive line is formed on a semiconductor substrate(200). An interlayer dielectric including a bottom oxide layer(240), a nitride layer, and a top oxide layer is formed on the resultant structure including the conductive line. A contact hole is formed by etching the interlayer dielectric. A bottom area of the contact hole is increased by a cleaning process. The contact hole is buried by a plug material. A polishing process is performed to expose the nitride layer.
机译:目的:提供一种制造接地插塞的方法,以通过清洁工艺固定接触孔的底部区域来改善接触电阻特性。构成:在半导体衬底(200)上形成导线。在包括导线的所得结构上形成包括底部氧化物层(240),氮化物层和顶部氧化物层的层间电介质。通过蚀刻层间电介质来形成接触孔。接触孔的底部面积通过清洁工艺而增加。接触孔被塞子材料掩埋。进行抛光工艺以暴露氮化物层。

著录项

  • 公开/公告号KR20050003297A

    专利类型

  • 公开/公告日2005-01-10

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20030044017

  • 发明设计人 JUNG TE O;

    申请日2003-06-30

  • 分类号H01L21/28;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:03

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