首页> 外国专利> CMP POLISHING HEAD SAVING RETAINING RING COST AND MEMBRANE COST USING AIR BAG AND OPERATING METHOD THEREOF

CMP POLISHING HEAD SAVING RETAINING RING COST AND MEMBRANE COST USING AIR BAG AND OPERATING METHOD THEREOF

机译:使用气囊的CMP抛光头节省挡圈成本和膜成本及其操作方法

摘要

PURPOSE: A CMP polishing head and an operating method thereof are provided to save the retaining ring cost and the membrane cost by polishing a wafer under the down force of an air bag catching the wafer by vacuum. CONSTITUTION: A first head(21) connected with a rotating shaft(20) is rotated under the down force. A second head(23) formed at the lower side of the first head is rotated together with the first head. An air bag(22) delivering the down force of the first head to the second head is formed between the first head and the second head. A multitude of wafer hold cells delivering the down force to a wafer(26) caught by vacuum are connected with the lower side of the second head.
机译:用途:提供一种CMP抛光头及其操作方法,以通过在通过真空吸附晶片的气囊的向下力下抛光晶片来节省固定环成本和膜成本。组成:与旋转轴(20)连接的第一头部(21)在向下的力作用下旋转。形成在第一头部的下侧的第二头部(23)与第一头部一起旋转。在第一头部和第二头部之间形成有将第一头部的向下的力传递至第二头部的气囊(22)。将向下的力传递到被真空捕获的晶片(26)的多个晶片保持单元与第二头的下侧连接。

著录项

  • 公开/公告号KR20050007877A

    专利类型

  • 公开/公告日2005-01-21

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030047495

  • 发明设计人 LEE JIN KYU;

    申请日2003-07-12

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:58

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号