首页> 外国专利> CMP APPARATUS WITH IMPROVED CONDITIONER FOR CONTROLLING UNIFORMLY SURFACE OF POLISHING PAD AND REDUCING WORKING-TIME AND COSTS FOR MAINTENANCE AND CONDITIONING METHOD THEREOF

CMP APPARATUS WITH IMPROVED CONDITIONER FOR CONTROLLING UNIFORMLY SURFACE OF POLISHING PAD AND REDUCING WORKING-TIME AND COSTS FOR MAINTENANCE AND CONDITIONING METHOD THEREOF

机译:具有改进的调节器的CMP设备,用于均匀地控制抛光垫的表面并减少工作时间和维护成本以及其调节方法

摘要

PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus and a conditioning method thereof are provided to control uniformly a surface of a polishing pad and to reduce working-time and costs for maintenance by using a ring-type conditioner. CONSTITUTION: A CMP apparatus includes a polishing pad(19), a conditioner, and a head part. The conditioner(23) contacts the polishing pad. The head part(11) is used for loading a wafer(W) opposite to the polishing pad. The conditioner encloses an edge of the wafer. The conditioner is parallel with the polishing pad. The conditioner is formed like a ring-type structure.
机译:目的:提供一种CMP(化学机械抛光)设备及其修整方法,以通过使用环形修整器来均匀地控制抛光垫的表面并减少工作时间和维护成本。组成:CMP设备包括抛光垫(19),修整器和头部。修整器(23)接触抛光垫。头部(11)用于装载与抛光垫相对的晶片(W)。调节器包围晶片的边缘。调节剂与抛光垫平行。调节剂形成为环状结构。

著录项

  • 公开/公告号KR20050000112A

    专利类型

  • 公开/公告日2005-01-03

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030040691

  • 发明设计人 JEONG JAE DEOK;

    申请日2003-06-23

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:05

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