首页> 外国专利> METHOD FOR INCREASING THICKNESS OF PHOTORESIST TO STABLY FORM PHOTORESIST OF DESIRED THICKNESS

METHOD FOR INCREASING THICKNESS OF PHOTORESIST TO STABLY FORM PHOTORESIST OF DESIRED THICKNESS

机译:将光致抗蚀剂的厚度增加到所需厚度的稳定形式的光致抗蚀剂的方法

摘要

PURPOSE: A method for increasing the thickness of photoresist is provided to stably form photoresist of a desired thickness by interposing a layer between the first photoresist layer and the second photoresist layer. CONSTITUTION: After the first photoresist is coated on a semiconductor substrate, a patterning process and an exposure process are performed. An insulation layer is deposited. After the second photoresist is coated, a patterning process and an exposure process are performed. The exposed insulation layer is etched. The first photoresist is developed. Either one of a nitride layer or an oxide layer is used as the insulation layers.
机译:用途:提供一种增加光致抗蚀剂厚度的方法,以通过在第一光致抗蚀剂层和第二光致抗蚀剂层之间插入一层来稳定地形成期望厚度的光致抗蚀剂。组成:在半导体衬底上涂覆第一光刻胶后,执行构图工艺和曝光工艺。沉积绝缘层。在涂覆第二光刻胶之后,执行构图工艺和曝光工艺。暴露的绝缘层被蚀刻。显影第一光刻胶。氮化物层或氧化物层之一被用作绝缘层。

著录项

  • 公开/公告号KR20050009852A

    专利类型

  • 公开/公告日2005-01-26

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030049145

  • 发明设计人 PARK IN SEONG;

    申请日2003-07-18

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:56

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