首页> 外国专利> MASK FOR EXPOSURE HAVING BLOCK AREA CONSTRUCTED FROM A PLURALITY OF PATTERN SITES COMPRISING LIGHT SCREENING PATTERN AND TRANSPARENT PATTERN, AND PREPARATION METHOD OF MASK PATTERN

MASK FOR EXPOSURE HAVING BLOCK AREA CONSTRUCTED FROM A PLURALITY OF PATTERN SITES COMPRISING LIGHT SCREENING PATTERN AND TRANSPARENT PATTERN, AND PREPARATION METHOD OF MASK PATTERN

机译:由包含光筛分模式和透明模式的多个模式站点构成的具有遮挡区域的遮罩以及遮罩模式的制备方法

摘要

PURPOSE: A mask for exposure and a method for preparing a mask pattern are provided, to allow a three dimensional shape (for example, lens) having a high precision to be produced by designing a mask pattern where the error of aperture size of a mask pattern and the error due to resist residual film characteristics are reflected in the design and preparation of a binary mask whose strength is modulated by using a 0 order light diffracted light. CONSTITUTION: The mask for exposure(M) has a block area(BA) constructed by arranging a plurality of pattern sites(PS) which comprise a light screening pattern for screening the lighting light from an exposure device and a transparent pattern for transmitting the lighting light in an equal ratio and an equal pitch, wherein the plurality of pattern sites constituting the block area is arranged to allow to the pitch of the light screening pattern to be equal to that of the transparent pattern and to allow the ratio to change slowly.
机译:用途:提供一种用于曝光的掩模和一种掩模图案的制备方法,以允许通过设计掩模图案的掩模孔径尺寸误差产生具有高精度的三维形状(例如,透镜)图案和由于抗蚀剂残留膜特性引起的误差反映在二元掩模的设计和制备中,该二元掩模的强度通过使用0阶光衍射光进行调制。构成:曝光用掩模(M)具有一个块状区域(BA),该块状区域通过布置多个图案位点(PS)构成,这些图案位点包括用于遮挡来自曝光设备的照明光的遮光图案和用于透射光的透明图案以相等的比率和相等的间距发射光,其中,布置构成块区域的多个图案部位,以使遮光图案的间距与透明图案的间距相等,并使比率缓慢变化。

著录项

  • 公开/公告号KR20050013959A

    专利类型

  • 公开/公告日2005-02-05

    原文格式PDF

  • 申请/专利权人 SONY CORPORATION;

    申请/专利号KR20040058981

  • 发明设计人 INOUE KAZUHARU;OZAWA KEN;

    申请日2004-07-28

  • 分类号G03F1/08;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:51

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