首页> 外国专利> METHOD FOR FORMING AlOxNy BUFFER LAYER FOR GROWING InAlGaN-BASED THIN FILM TO IMPROVE QUALITY OF InAlGaN-BASED THIN FILM

METHOD FOR FORMING AlOxNy BUFFER LAYER FOR GROWING InAlGaN-BASED THIN FILM TO IMPROVE QUALITY OF InAlGaN-BASED THIN FILM

机译:用于生长InAlGaN基薄膜的AlOxNy缓冲层的形成方法以提高InAlGaN基薄膜的质量

摘要

PURPOSE: A method for forming an AlOxNy buffer layer for growing an InAlGaN-based thin film is provided to improve the quality of an InAlGaN-based thin film by minimizing a lattice mismatch between a sapphire substrate and the InAlGaN-based thin film. CONSTITUTION: After aluminium metal is deposited on a substrate, the aluminium metal is oxidized to form an AlOx layer. A nitrogen precursor is injected to the inside of an MOCVD(metal organic chemical vapor deposition) reactor at a uniform temperature so that the AlOx layer is nitridized to form an AlOxNy layer(40) and the AlOxNy layer is used as a buffer layer for growing an InAlGaN-based thin film(50).
机译:目的:提供一种用于形成用于生长InAlGaN基薄膜的AlOxNy缓冲层的方法,以通过最小化蓝宝石衬底和InAlGaN基薄膜之间的晶格失配来提高InAlGaN基薄膜的质量。组成:在基板上沉积铝金属后,铝金属被氧化形成AlOx层。在均匀的温度下将氮前驱物注入MOCVD(金属有机化学气相沉积)反应器内部,以便将AlOx层氮化以形成AlOxNy层(40),并将AlOxNy层用作生长的缓冲层InAlGaN基薄膜(50)。

著录项

  • 公开/公告号KR20050014344A

    专利类型

  • 公开/公告日2005-02-07

    原文格式PDF

  • 申请/专利权人 EPIVALLEY CO. LTD.;

    申请/专利号KR20030052935

  • 发明设计人 PARK EUN HYUN;

    申请日2003-07-30

  • 分类号H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:52

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