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PORTABLE SPEED MEASUREMENT APPARATUS TO MEASURE IN PLACE RECIPROCATING WAFER TRANSFERRING MOTION

机译:便携式速度测量装置在往复式晶圆传送运动中的测量

摘要

Purpose: a light velocity measuring device is arranged to measure the reciprocating motion of wafer transfer equipment regardless of when and where is in an ion implantation process etc.. Construction: a light velocity measuring device includes an importation, a control unit, a display part. Importation (100) output is used as a scheduled detecting signal, by amplifying and being formed analog signal, after the analog signal that the reciprocating motion read according to wafer transfer equipment generates. One control unit (200) receives detecting signal from importation, will test analog signal according to reciprocating motion and is converted into a digital signal, digital signal is by being a control signal according to each speed output of calculating is moved back and forth. One display part (300) passes through each speed of a number according to control signal representation, after receiving control signal from control unit.
机译:目的:一种光速测量装置,无论离子注入过程中的时间和地点如何,都可以测量晶片传输设备的往复运动。结构:光速测量装置包括一个装置,一个控制单元,一个显示部件。在根据晶片传送设备读取的往复运动产生的模拟信号产生之后,通过放大并形成模拟信号,将输入(100)输出用作预定的检测信号。一个控制单元(200)从输入端接收检测信号,将根据往复运动对模拟信号进行测试并将其转换为数字信号,数字信号通过作为控制信号根据计算出的各个速度来回移动。在从控制单元接收到控制信号之后,一个显示部分(300)根据控制信号表示通过数字的每个速度。

著录项

  • 公开/公告号KR20050019596A

    专利类型

  • 公开/公告日2005-03-03

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030057465

  • 发明设计人 CHOI JONG YUN;

    申请日2003-08-20

  • 分类号H01L21/02;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:47

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