首页> 外国专利> RETICLE FOR MANUFACTURING SEMICONDUCTOR WITH PRE-ALIGNMENT MARKS TO IMPROVE EXACTNESS AND REPRODUCTIVITY OF PRE-ALIGNMENT AND RETICLE PRE-ALIGNING METHOD USING THE SAME

RETICLE FOR MANUFACTURING SEMICONDUCTOR WITH PRE-ALIGNMENT MARKS TO IMPROVE EXACTNESS AND REPRODUCTIVITY OF PRE-ALIGNMENT AND RETICLE PRE-ALIGNING METHOD USING THE SAME

机译:制造带有预对准标记的半导体的掩模版,以提高预对准的精确度和可重复性,以及使用该掩模版的掩模版预对准方法

摘要

PURPOSE: A reticle for manufacturing a semiconductor and a reticle pre-aligning method using the same are provided to improve exactness and reproductivity of pre-alignment of the reticle by using a plurality of pre-alignment marks formed on a third surface of the reticle itself. CONSTITUTION: A reticle(10') includes a quartz plate, a chrome pattern, a plurality of alignment marks and a plurality of pre-alignment marks. The quartz plate(14) includes a first surface(11), a second surface(12) opposite to the first surface and a plurality of third surfaces(13) between the first and second surfaces. The chrome pattern(15) is formed on the first surface of the quartz plate. The plurality of alignment marks(16) are formed on a periphery of the quartz plate. The plurality of pre-alignment marks(17) are formed at least two third surfaces opposite to each other.
机译:目的:提供一种用于制造半导体的掩模版以及使用该掩模版的掩模版预对准方法,以通过使用在掩模版本身的第三表面上形成的多个预对准标记来提高掩模版的预对准的准确性和再现性。 。组成:标线片(10')包括一块石英板,一个镀铬图案,多个对准标记和多个预对准标记。石英板(14)包括第一表面(11),与第一表面相对的第二表面(12)以及在第一和第二表面之间的多个第三表面(13)。铬图案(15)形成在石英板的第一表面上。多个对准标记(16)形成在石英板的周围。多个预对准标记(17)形成在彼此相对的至少两个第三表面上。

著录项

  • 公开/公告号KR20050023119A

    专利类型

  • 公开/公告日2005-03-09

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030060194

  • 发明设计人 KANG KYUNG HO;

    申请日2003-08-29

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:46

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