SEMICONDUCTOR DEVICE HAVING A SCAN CHAIN FOR DEBUGGING AND DEBUGGING METHOD USING THE SCAN CHAIN

摘要

A method of debugging by using the semiconductor device and it is disclosed for performing the debugging using the scan chain. When operating a semiconductor device in a normal mode, naebuyi respective functional blocks and generates an output signal corresponding to a predetermined type. Then, to form a scan chain inputs the outputs of the functional blocks in the scan chain. The output signals of the functional blocks includes a plurality of flip forming a scan chain-flop are stored in the flip-are sequentially output to the outside of the semiconductor device according to the internal clock input to the flop. It is also possible to separately form a scan chain formed of one or more in series to extend the length of the scan chain. The length of the scan chain may be located a multiplexer between each scan chain and to control it to extend its length. To this end, the semiconductor device mode control, with a scan chain and output terminals.