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HALO-FREE NON-RECTIFYING CONTACT ON CHIP WITH HALO SOURCE/DRAIN DIFFUSION

机译:带有晕圈源/漏扩散的芯片上无晕圈的非整流触点

摘要

A semiconductor chip includes a semiconductor substrate having a rectifying contact diffusion and a non-rectifying contact diffusion. A halo diffusion is adjacent the rectifying contact diffusion and no halo diffusion is adjacent the non-rectifying contact diffusion. The rectifying contact diffusion can be a source/drain diffusion of an FET to improve resistance to punch-through. The non-rectifying contact diffusion may be an FET body contact, a lateral diode contact, or a resistor or capacitor contact. Avoiding a halo for non-rectifying contacts reduces series resistance and improves device characteristics. In another embodiment on a chip having devices with halos adjacent diffusions, no halo diffusion is adjacent a rectifying contact diffusion of a lateral diode, significantly improving ideality of the diode and increasing breakdown voltage.
机译:半导体芯片包括具有整流接触扩散和非整流接触扩散的半导体基板。晕圈扩散与整流接触扩散相邻,并且没有晕圈扩散与非整流接触扩散相邻。整流接触扩散可以是FET的源/漏扩散,以提高抗穿通性。非整流触点扩散可以是FET主体触点,横向二极管触点或电阻器或电容器触点。避免非整流触点出现光晕会降低串联电阻并改善器件特性。在具有光晕邻近扩散的器件的芯片上的另一实施例中,没有光晕扩散邻近横向二极管的整流接触扩散,从而显着提高了二极管的理想性并增加了击穿电压。

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