首页> 外国专利> Charge trapping memory cell used as transistor comprises semiconductor body or substrate having upper side with curve in channel region

Charge trapping memory cell used as transistor comprises semiconductor body or substrate having upper side with curve in channel region

机译:用作晶体管的电荷俘获存储单元包括半导体主体或衬底,该衬底具有在沟道区域中具有弯曲的上侧。

摘要

A charge trapping memory cell comprises a semiconductor body (1) or substrate having an upper side with a curve in the channel region. The curve is structured so that channel width measured across the connection line between source/drain regions and delimited by STI insulations is larger compared with a planar structure of the channel width. The curve is at least two thirds of the channel width.
机译:电荷俘获存储单元包括具有在沟道区域中具有弯曲的上侧的半导体主体(1)或衬底。该曲线的结构使得在源极/漏极区域之间的连接线上测得的沟道宽度与STI绝缘层相比比沟道宽度的平面结构更大。该曲线至少是通道宽度的三分之二。

著录项

  • 公开/公告号DE10333549B3

    专利类型

  • 公开/公告日2005-01-13

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2003133549

  • 发明设计人 LAU FRANK;WILLER JOSEF;

    申请日2003-07-23

  • 分类号H01L27/108;H01L27/115;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:19

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