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Electric short circuit protection switch e.g. for testing of integrated circuits, has decision logic unit having comparator units connected for testing integrated circuits

机译:电气短路保护开关,例如用于测试集成电路,具有连接有用于测试集成电路的比较器单元的判决逻辑单元

摘要

The switch has a decision logic unit having comparator units connected for testing integrated circuits (ICs). The testing of ICs is performed by a connection to a signal generator and the signal output monitored by the comparators. In addition, a digital controller further controls the outputs from a testing bed and is trained for the ICs. Independent claims are also included for the following; (1) a test device; (2) a load board; (3) a computer program.
机译:该开关具有判决逻辑单元,该判决逻辑单元具有连接的比较器单元,用于测试集成电路(IC)。通过连接到信号发生器并通过比较器监视信号输出来执行IC的测试。此外,数字控制器还可以控制测试台的输出,并接受有关IC的培训。以下还包括独立权利要求; (1)测试装置; (2)承重板; (3)计算机程序。

著录项

  • 公开/公告号DE10341836A1

    专利类型

  • 公开/公告日2005-04-28

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2003141836

  • 发明设计人 SATTLER SEBASTIAN;MATTES HEINZ;

    申请日2003-09-09

  • 分类号G01R31/3167;G01R35/00;H03M1/10;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:15

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