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Dynamic light scattering measuring device with the use of the phase modulation interference method

机译:利用相位调制干涉法的动态光散射测定装置

摘要

A device for measuring dynamic light scattering using a phase modulation - interference method comprises an optical coupler 5 for the distribution of light from a low coherence light source 2, a conversion of lens 10, to radiate a can be divided by the optical coupler 5 to a portion of the light sample medium 9, phase modulators 7, 8 to the module can of the phase of the other of the optical coupler 5 divided light portion, a spectrally measuring device 12 for measuring of the spectrum of the interference light of the phase modulated reference light and of the scattered light emanating from the sample medium 9, and an analysis instrument for measuring the dynamic light scattering of particles of the samples medium, based on at least any one of the spectrum of the first order in accordance with the fundamental frequency of the phase modulation signal or a spectrum of a higher order corresponding to a frequency equal to two, three or more times the fundamental frequency, which in the of the spectrally measuring device 12 measured interference light spectrum appear. The absolute value of s / l, the by norminieren of the light path length s within the medium to the mean free path length l of the particles is obtained, it is determined in order to not be greater than 3. dynamic properties of a medium a high concentration, with a high degree of precision, based on the scattered light, of the medium to be measured, a high concentration.
机译:利用相位调制-干涉法测量动态光散射的装置包括光耦合器5,该光耦合器5用于分配来自低相干光源2的光,将透镜10转换成辐射的光,该光耦合器可以由光耦合器5划分为:一部分光样本介质9,相位调制器7,模块模块8的另一半可以将光耦合器5的相分离的光部分,光谱测量装置12用于测量该相的干涉光的光谱调制的参考光和从样品介质9发出的散射光,以及分析仪器,用于根据基波的一阶光谱中的至少任意一个测量样品介质颗粒的动态光散射调相信号的频率或对应于等于基频两倍,三倍或三倍以上的频率的高阶频谱光谱测量装置12出现测量到的干涉光谱。获得介质中的光路长度s的绝对值s / l的绝对值相对于粒子的平均自由光程长度l的绝对值s,确定为不大于3。介质的动态特性基于散射光的高浓度,高精确度的被测介质为高浓度。

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