首页> 外国专利> Memory cell e.g. FET, programming method for computer system, involves applying additional programming pulse to selected cells that are programmed for highest state, without verifying state of cells, for enlarging read margin

Memory cell e.g. FET, programming method for computer system, involves applying additional programming pulse to selected cells that are programmed for highest state, without verifying state of cells, for enlarging read margin

机译:存储单元FET,一种用于计算机系统的编程方法,包括将附加的编程脉冲施加到被编程为最高状态的选定单元,而不验证单元的状态,以扩大读取余量

摘要

The method involves applying programming pulse and verification voltage to memory cells to verify that each cell has reached a desired state. Read voltage that equals the verification voltage is applied to read data from the cells. The cells that are programmed for highest state are selected. Additional programming pulse is applied to the selected cells without verifying the state of selected cells for enlarging a read margin. Independent claims are also included for the following: (A) a method of operating a memory device comprising programming a set of memory cells to a desired state (B) a nonvolatile memory device comprising a control circuitry coupled to memory cells.
机译:该方法包括向存储单元施加编程脉冲和验证电压,以验证每个单元已经达到期望状态。施加等于验证电压的读取电压以从单元读取数据。选择为最高状态编程的单元。将附加的编程脉冲施加到所选单元,而无需验证所选单元的状态以扩大读取余量。还包括以下各项的独立权利要求:(A)一种操作存储设备的方法,包括将一组存储单元编程到所需状态(B)一种非易失性存储设备,其包括与存储单元耦合的控制电路。

著录项

  • 公开/公告号DE102005009700A1

    专利类型

  • 公开/公告日2005-09-22

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO LTD;

    申请/专利号DE20051009700

  • 发明设计人 PARK DONG-HO;LEE SEUNG-KEUN;

    申请日2005-02-24

  • 分类号G11C16/34;

  • 国家 DE

  • 入库时间 2022-08-21 22:00:39

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