首页> 外国专利> process for the production of czochralski silicon without agglomierte eigenzwischengitteratom defects

process for the production of czochralski silicon without agglomierte eigenzwischengitteratom defects

机译:无团聚体本征维氏缺陷原子缺陷的czochralski硅的生产方法

摘要

A process for heat treating a silicon wafer to dissolve B-type agglomerated interstitial defects present therein. The process includes heating the silicon wafer at a temperature for a time sufficient to dissolve B-defects, the wafer being heated to said temperature at a rate sufficient to prevent B-defects from becoming stabilized such that these defects are rendered incapable of being dissolved.
机译:一种热处理硅片以溶解其中存在的B型团聚间隙缺陷的方法。该工艺包括在足以溶解B缺陷的温度下加热硅晶片,以足以防止B缺陷变得稳定的速率将晶片加热到所述温度,使得这些缺陷不能被溶解。

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