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Measuring dynamic light scattering of particles by using a phase modulation interferometric method

机译:使用相位调制干涉法测量粒子的动态光散射

摘要

An apparatus 1 for measuring dynamic light scattering of particles using a phase modulation interference method comprising: a low coherence light source 2 such as a super luminance diode; one measuring light path 4a, 4c, irradiating the particles in a sample medium 9 and a reference light path 4b. A phase modulating means, such as a mirror 7 vibrated by a piezoelectric-transducer 8 modulates the phase of the reference beam. A spectrum measurement means 12 measures the spectrum of the interference light between the phase modulated reference beam and scattered light outgoing the sample medium. An analyser measures scattering of the particles of the sample based on at least any one order number of the order spectrums or higher order spectra corresponding to the basic frequency of the phase-modulator 7. The ratio of normalising light path, s, to mean free path, L of the particles is set to be not more than 3. The phase modulation means may modulate the physical path of light by less than the coherence length of the light source.
机译:一种使用相位调制干涉方法测量颗粒的动态光散射的设备1,包括:低相干光源2,例如超亮度二极管;以及一个测量光路4a,4c,其照射样品介质9中的颗粒和参考光路4b。诸如由压电换能器8振动的反射镜7之类的相位调制装置调制参考光束的相位。光谱测量装置12测量在相位调制参考光束和从样本介质射出的散射光之间的干涉光的光谱。分析器基于与调相器7的基本频率相对应的至少一个阶数的阶次光谱或更高阶的光谱来测量样品的颗粒的散射。归一化光路s与平均自由光的比率。将粒子的光路L设置为不大于3。相位调制装置可以将光的物理路径调制为小于光源的相干长度。

著录项

  • 公开/公告号GB2407379A

    专利类型

  • 公开/公告日2005-04-27

    原文格式PDF

  • 申请/专利权人 * OTSUKA ELECTRONICS CO. LTD.;

    申请/专利号GB20040023282

  • 发明设计人 TOSHIAKI * IWAI;KATSUHIRO * ISHII;

    申请日2004-10-20

  • 分类号G01N21/47;G01N15/02;G01N21/17;

  • 国家 GB

  • 入库时间 2022-08-21 21:57:31

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