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TRACE ANALYSIS SYSTEM AND TRACE ANALYSIS METHOD

机译:痕量分析系统和痕量分析方法

摘要

PPROBLEM TO BE SOLVED: To increase a information storage quantity of a trace memory and a code quantity required for debugging. PSOLUTION: The trace analysis system 48 is provided with: a trace analysis table 46; an instruction restoring part 62 restoring and transmitting an execution address and an execution code of trace information; and an object code list storage part 60. An object code list and trace information are read, they are cut from a final storage address stored in an address register 28 for every trace information in an opposite time direction and they are registered in the trace analysis table 46. A trace analysis method is provided with a step for inputting trace information which is compressed and converted by the format of different length, and a final storage address in the trace analysis table, a step for analyzing data in a direction opposite to a time axis, sequentially cutting trace information in a unit of information and registering it in the trace analysis table, and a step for inputting the object code list and restoring it into the execution address and the instruction code of registered trace information. PCOPYRIGHT: (C)2006,JPO&NCIPI
机译:

要解决的问题:增加跟踪存储器的信息存储量和调试所需的代码量。解决方案:痕量分析系统48具有:痕量分析表46;和指令恢复部62恢复并发送跟踪信息的执行地址和执行代码。读取目标代码列表和跟踪信息,从存储在地址寄存器28中的最终存储地址中切出目标代码列表和跟踪信息,用于每个跟踪信息在相反的时间方向,并将它们记录在跟踪分析中表46.一种跟踪分析方法,其具有以下步骤:输入通过不同长度的格式压缩和转换的跟踪信息;以及在跟踪分析表中的最终存储地址;用于在与数据的相反方向上分析数据的步骤。时间轴,以信息为单位依次剪切跟踪信息并将其注册在跟踪分析表中,以及输入目标代码列表并将其恢复到已注册跟踪信息的执行地址和指令代码中的步骤。

版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006012066A

    专利类型

  • 公开/公告日2006-01-12

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20040191661

  • 发明设计人 KIMURA KATSUYUKI;

    申请日2004-06-29

  • 分类号G06F11/28;

  • 国家 JP

  • 入库时间 2022-08-21 21:56:13

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