LINE DEFECT INSPECTION METHOD, LINE DEFECT DETECTION DEVICE, LINE DEFECT DETECTION PROGRAM, AND RECORDING MEDIUM FOR RECORDING PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a line defect inspection method capable of detecting highly accurately even a line defect generated from linearly-aligned pixels having respectively a defect on a part in each pixel.;SOLUTION: This line defect inspection method has an imaging process ST100 for imaging a display image on an organic EL panel by an imaging means, a feature quantity calculation process ST110 for calculating the feature quantity of each display pixel by performing image processing of imaged image data and arraying the feature quantity of each display pixel corresponding to the display image, a feature quantity arrayed image creating process ST111 for arraying the feature quantity of each display pixel corresponding to the display image, an integration process ST120 for calculating an integrated value by integrating each feature quantity along a prescribed integration route, a threshold setting process ST130 for setting a threshold for detecting the line defect, a comparison process ST140 for comparing the integrated value with the threshold, and a display process (line defect discrimination display process) ST150 for discriminating and displaying the integration route where existence of the line defect is recognized on a display part.;COPYRIGHT: (C)2006,JPO&NCIPI