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SAMPLE FOR EVALUATING NANOLEVEL STRUCTURAL COMPOSITION, ITS MANUFACTURING METHOD, AND EVALUATION METHOD OF NANOLEVEL STRUCTURAL COMPOSITION
SAMPLE FOR EVALUATING NANOLEVEL STRUCTURAL COMPOSITION, ITS MANUFACTURING METHOD, AND EVALUATION METHOD OF NANOLEVEL STRUCTURAL COMPOSITION
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机译:纳米结构组成的评估样品,其制造方法和评估方法
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摘要
PROBLEM TO BE SOLVED: To provide a sample for evaluating a nanolevel structural composition, its manufacturing method, and an evaluation method of the nanolevel structural composition wherein it is possible not only to prevent the charge-up in the sample having a multilayered thin film structure in which an insulating layer is interposed but also to evaluate a surface structure precisely.;SOLUTION: A protruded sample part 2 comprises the multilayered thin film structure 3 having the insulating layer 4 interposed at least in a part thereof, and the whole surface of the surface area straddling at least the insulating layer 4 from the leading end part of the protruded sample part 2 of the sample for evaluating the nanolevel structural composition is covered with a conductive material 6 comprising a substance of which the evaporation electric field is lower than that of a conductive substance 5 for constituting a multilayered structure, to provide the sample for evaluating the nanolevel structural composition.;COPYRIGHT: (C)2006,JPO&NCIPI
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