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ALIGNER, ALIGNING METHOD, AND PROCESS FOR FABRICATING DEVICE HAVING MICROPATTERN

机译:警报器,警报方法和制造具有微型计算机的设备的过程

摘要

PROBLEM TO BE SOLVED: To provide an EUV aligner in which the lifetime up to overhaul is prolonged by reducing adsorption of organic substances into a reflector as much as possible so that a carbon coating is not formed easily and suppressing deterioration in optical characteristics.;SOLUTION: The aligner comprises a projection optical system having a plurality of reflectors (M1-M6) performing exposure and transfer of a pattern formed on a mask onto a photosensitive substrate using extreme ultravoilet light wherein at least one of the plurality of reflectors is held in a state insulated from the outside.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种EUV对准器,其中通过尽可能减少有机物质在反射器中的吸收来延长大修寿命,从而不易形成碳涂层并抑制光学特性变差。 :对准器包括投影光学系统,该投影光学系统具有多个反射器(M1-M6),该反射器使用极紫外光进行曝光并将掩模上形成的图案转印到感光基板上,其中多个反射器中的至少一个保持在国家/地区与外界隔绝。;版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006210602A

    专利类型

  • 公开/公告日2006-08-10

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20050020003

  • 发明设计人 AOKI TAKASHI;

    申请日2005-01-27

  • 分类号H01L21/027;G03F7/20;G21K1/06;G21K5/02;

  • 国家 JP

  • 入库时间 2022-08-21 21:52:55

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