UNEVENNESS DEFECT DETECTING METHOD AND UNEVENNESS DEFECT DETECTOR

摘要

PROBLEM TO BE SOLVED: To provide an unevenness defect detecting method capable of detecting an unevenness defects with high precision, and an unevenness defect detector.;SOLUTION: The unevenness defect detecting method has an unevenness component emphasizing processing process for applying an unevenness component emphasizing filter to each of the pixels of a photographed image to emphasizing unevenness components and an unevenness defect detecting process for detecting the uneven defect on the basis of the unevenness components emphasized value of each of the pixels obtained in the unevenness component emphasizing processing process. In the unevenness component emphasizing processing process, the luminance-comparing pixels separated from a target pixel by a predetermined distance and arranged to the periphery of the target pixel are rearranged, in the order of the magnitudes of the luminance value of the respective luminance comparing pixels to calculate the luminance average value of a predetermined number of pixels positioned at a central part and the unevenness component emphasizing filter for calculating the difference between the luminance average value and the luminance value of the target pixel to set the unevenness components emphasized value of the target pixel is used to emphasize the unevenness components. In the unevenness defect detecting process, the uneven defect is detected by comparing the unevenness components emphasized value of each of the pixels with a predetermined threshold to extract the pixel of the unevenness defect candidates.;COPYRIGHT: (C)2006,JPO&NCIPI