首页> 外国专利> CHAMBER FOR LIQUID INSPECTION, LIQUID ANALYZING APPARATUS USING CHAMBER FOR LIQUID INSPECTION, AND THICKNESS MEASUREMENT METHOD OF CHAMBER FOR LIQUID INSPECTION

CHAMBER FOR LIQUID INSPECTION, LIQUID ANALYZING APPARATUS USING CHAMBER FOR LIQUID INSPECTION, AND THICKNESS MEASUREMENT METHOD OF CHAMBER FOR LIQUID INSPECTION

机译:液体检查室,使用液体检查室的液体分析装置以及液体检查室的厚度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a chamber for liquid inspection with less error of chamber thickness.;SOLUTION: The chamber for liquid inspection comprises a base substrate 11 and an upper cover 13 stuck to the upper part of the base substrate 11 through an adhesive layer 12, and a first recessed part 14 is disposed on the base substrate 11 side of the upper cover 13. The chamber further comprises a first chamber 15 formed by this first recessed part 14 and the base substrate 11, a second recessed part 18 having a thickness different from that of the first recessed part 14 to be connected to the upper cover 13, and a second chamber 19 formed of the second recessed part 18 and the base substrate 11. Thus, the chamber for liquid inspection with the small thickness error can be provided.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种用于液体检查的腔室,其腔室厚度的误差较小。解决方案:用于液体检查的腔室包括基底基板11和通过粘合剂粘附到基底基板11上部的上盖13层12,第一凹进部分14设置在上盖13的基础基板11侧。该腔室还包括由该第一凹进部分14和基础基板11形成的第一腔室15,第二凹进部分18具有厚度不同于将要连接到上盖13的第一凹进部分14的厚度,以及由第二凹进部分18和基础基板11形成的第二腔室19。这样,厚度误差小的液体检查室可以提供。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006145452A

    专利类型

  • 公开/公告日2006-06-08

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20040338436

  • 发明设计人 AZUMA NOBUYASU;

    申请日2004-11-24

  • 分类号G01N21/07;G01N21/59;

  • 国家 JP

  • 入库时间 2022-08-21 21:52:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号