CELL PROPERTY CHARACTERIZING METHOD IN CONSIDERATION OF WAVEFORM DISTORTION AND METHOD FOR CALCULATING DELAY TIME OF SEMICONDUCTOR INTEGRATED CIRCUIT USING THE METHOD

摘要

PROBLEM TO BE SOLVED: To propose a method for characterizing a cell property so that a delay time in a cell can be calculated accurately even when a distortion is caused in an input waveform to the cell and an output waveform corresponding to the size of the cell's driving capacity.;SOLUTION: Considering that there may be a case where a mirror effect occurs corresponding to a magnitude of a driving load that a cell drives and a distortion is caused to an input waveform and an output waveform of a cell attributable to the mirror effect, one effective input terminal capacitance effectively equal to the cell causing the distortion of the waveform by the mirror effect and the driving load connected to it is calculated (Step 1103). Then the obtained effective input terminal capacitance is characterized as an input slope waveform and a function of the driving load, and is shown in table data 11.;COPYRIGHT: (C)2006,JPO&NCIPI