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The n doping Si and Te simultaneously die GaP monocrystal substrate, the production manner, as a dopant of the epitaxial substrate and

机译:n掺杂的Si和Te同时模制GaP单晶衬底,作为制造方法,作为外延衬底的掺杂剂和

摘要

PROBLEM TO BE SOLVED: To provide an n-type GaP single crystal substrate capable of being suitably used to manufacture a green light emitting diode capable of driving on a low forward voltage with high luminance and to provide a method for manufacturing the same.;SOLUTION: In the n-type GaP single crystal substrate in which Si and T are simultaneously doped as n-type dopants, the sum of an Si concentration and a Te concentration in the n-type GaP single crystal substrate is set to 2×1017 to 2×1018 cm-3, the Si concentration is set to 2×1016 to 8×1017 cm-3, and the Te concentration is set to 1×1017 to 2×1017 cm-3.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种n型GaP单晶衬底,其能够适合用于制造能够以高亮度在低正向电压上驱动的绿色发光二极管,并提供一种制造该方法的方法。 :在同时将Si和T掺杂为n型掺杂剂的n型GaP单晶衬底中,将n型GaP单晶衬底中的Si浓度和Te浓度之和设为2×10 <10。 Sup> 17 到2×10 18 cm -3 ,Si浓度设置为2×10 16 到8×; 10 17 cm -3 ,并且Te浓度设置为1×10 17 到2×10 17 cm -3 .;版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP3797124B2

    专利类型

  • 公开/公告日2006-07-12

    原文格式PDF

  • 申请/专利权人 昭和電工株式会社;

    申请/专利号JP20010074304

  • 发明设计人 吉永 敦;

    申请日2001-03-15

  • 分类号H01L33/00;C30B29/44;

  • 国家 JP

  • 入库时间 2022-08-21 21:51:34

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