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Ferroelectric thin film manufacturing method, the voltage applied etching apparatus, dielectric crystal wafer strength and dielectric crystal thin film substrate strength

机译:铁电薄膜的制造方法,施加电压的蚀刻装置,电介质晶片的强度和电介质薄膜基板的强度

摘要

And a surface of the other face of the one facing each other, and using a strong etching rate of the one surface is larger than the etching rate of the face of the other dielectric crystal in a state where the polarization directions are aligned in one direction and is strong this I for etching a surface of one of the dielectric crystal. As well as etching and applying a predetermined voltage to the ferroelectric crystal. As a result, the etching progresses, the thickness of the ferroelectric crystal reaches the desired thickness, the direction of polarization of the ferroelectric crystal is inverted, and the progress of the etching is stopped automatically. As a result, it is possible to manufacture a ferroelectric crystal thin film having a uniform thickness in a large area and very thin.
机译:并且,在极化方向沿一个方向排列的状态下,一个面的另一面彼此相对,并且使用一个面的强蚀刻速率大于另一个介电晶体的面的蚀刻速率。并且该I强用于蚀刻介电晶体之一的表面。以及蚀刻和向铁电晶体施加预定电压。结果,蚀刻进行,铁电晶体的厚度达到期望的厚度,铁电晶体的极化方向反转,并且蚀刻的进程自动停止。结果,可以制造在大面积上具有均匀厚度并且非常薄的铁电晶体薄膜。

著录项

  • 公开/公告号JPWO2005019508A1

    专利类型

  • 公开/公告日2006-10-19

    原文格式PDF

  • 申请/专利权人 長 康雄;パイオニア株式会社;

    申请/专利号JP20050513261

  • 发明设计人 長 康雄;尾上 篤;

    申请日2004-07-29

  • 分类号C30B33/10;C30B29/30;

  • 国家 JP

  • 入库时间 2022-08-21 21:50:39

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