首页> 外国专利> FERROELECTRIC THIN-FILM PRODUCTION METHOD, VOLTAGE-APPLICATION ETCHING APPARATUS, FERROELECTRIC CRYSTAL THIN-FILM SUBSTRATE, AND FERROELECTRIC CRYSTAL WAFER

FERROELECTRIC THIN-FILM PRODUCTION METHOD, VOLTAGE-APPLICATION ETCHING APPARATUS, FERROELECTRIC CRYSTAL THIN-FILM SUBSTRATE, AND FERROELECTRIC CRYSTAL WAFER

机译:铁电薄膜生产方法,电压施加刻蚀装置,铁电晶体薄膜基质和铁电晶体晶片

摘要

A ferroelectric thin-film production method produces a ferroelectric crystal thin film by using a ferroelectric crystal having first and second surfaces opposed to each other and having an etching rate of the first surface greater than that of the second surface and etching the first surface of the ferroelectric crystal. While etching, a predetermined voltage is applied to the ferroelectric crystal. When the etching progresses and the thickness of the ferroelectric crystal reaches a target value, the direction of polarization of the ferroelectric crystal are inverted and the progress of the etching automatically stops. Consequently, a ferroelectric crystal thin film extremely thin and uniform in thickness over a wide area can be produced.
机译:铁电薄膜的制造方法通过使用具有彼此相对的第一表面和第二表面并且第一表面的蚀刻速率大于第二表面的蚀刻速率的铁电晶体并蚀刻其第一表面来制造铁电晶体薄膜。铁电晶体。在蚀刻时,将预定电压施加到铁电晶体。当蚀刻进行并且铁电晶体的厚度达到目标值时,铁电晶体的极化方向反转并且蚀刻的进程自动停止。结果,可以生产出在很宽的区域上非常薄和厚度均匀的铁电晶体薄膜。

著录项

  • 公开/公告号EP1672102A4

    专利类型

  • 公开/公告日2009-03-11

    原文格式PDF

  • 申请/专利权人 CHO YASUO;PIONEER CORPORATION;

    申请/专利号EP20040771223

  • 发明设计人 CHO YASUO;ONOE A.;

    申请日2004-07-29

  • 分类号C30B33/10;C25F3/02;C30B29/30;C30B29/32;C30B33/00;C30B33/02;G11B9/02;H01L21/306;H01L21/311;

  • 国家 EP

  • 入库时间 2022-08-21 19:18:20

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