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Scanning probe microscope assembly and method for making spectrophotometric, near-filed, and scanning probe measurements
Scanning probe microscope assembly and method for making spectrophotometric, near-filed, and scanning probe measurements
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机译：扫描探针显微镜组件和用于进行分光光度，近场和扫描探针测量的方法
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摘要
A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.
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