首页> 外国专利> Deposition method of TiN film having a multi-layer structure

Deposition method of TiN film having a multi-layer structure

机译:具有多层结构的TiN膜的沉积方法

摘要

Provided is a method of depositing a metal nitride film having a multilayer structure and different deposition speeds on a substrate. The method is performed by forming a first lower metal nitride film on the substrate at a first deposition speed, forming a second lower metal nitride film on the first lower metal nitride film at a second deposition speed, and forming an upper metal nitride film having a large content of nitrogen (N) on a lower TiN film which is formed by the forming of the first lower metal nitride film and the second lower metal nitride film, at a third deposition speed, to improve stability with respect to exposure to air/moisture. The deposition speed of the metal nitride film having a multi-layer structure satisfies a relationship that the second deposition speed ≧the first deposition speed ≧the third deposition speed.
机译:提供一种在基板上沉积具有多层结构和不同沉积速度的金属氮化物膜的方法。该方法是通过以第一沉积速度在基板上形成第一下部金属氮化物膜,以第二沉积速度在第一下部金属氮化物膜上形成第二下部金属氮化物膜,以及形成具有高折射率的上部金属氮化物膜来执行的。通过以第三沉积速度形成第一下部金属氮化物膜和第二下部金属氮化物膜而形成的下部TiN膜上的大量氮(N),以提高相对于暴露于空气/湿气的稳定性。具有多层结构的金属氮化物膜的沉积速度满足第二沉积速度≥第一沉积速度≥第三沉积速度的关系。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号