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FILM DEPOSITION SYSTEM, FILM DEPOSITION METHOD, AND MANUFACTURING METHOD FOR MULTI-LAYER REFLECTING MIRROR

机译:多层反射镜的膜沉积系统,膜沉积方法和制造方法

摘要

PROBLEM TO BE SOLVED: To provide a film deposition system and a film deposition method, capable of easily controlling the film thickness distribution at a center part of a substrate and obtaining a desired film thickness distribution in a short time.;SOLUTION: In this film deposition system, atoms of a target are sputtered by heating the target or performing ion beam irradiation to the target in a sufficiently evacuated vessel, a substrate to be film-deposited having rotational- symmetric shape is rotated around the axis having rotational symmetry shape, a film thickness correction plate is disposed in the vicinity of the substrate, and the atoms are deposited on the substrate, and the film thickness correction plate has a plurality of apertures disposed at the spacing of not more than one half of the extension of penumbra of the film thickness correction plate in which particle lines are generated on the substrate during the film deposition in the vicinity of a part corresponding to the axis of rotational symmetry of the substrate, and an aperture with controlled aperture ratio in the radial direction.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种膜沉积系统和膜沉积方法,该膜沉积系统和膜沉积方法能够容易地控制基板中心部分的膜厚度分布并在短时间内获得所需的膜厚度分布。在沉积系统中,通过加热靶或在充分抽空的容器中对靶进行离子束辐照来溅射靶的原子,具有旋转对称形状的待沉积膜的基板绕具有旋转对称形状的轴旋转,膜厚校正板设置在基板附近,并且原子沉积在基板上,并且该膜厚校正板具有多个孔,这些孔以不大于半导体膜的半影延伸的一半的间隔设置。膜厚校正板,其中在膜沉积期间在对应于t的部分附近在基板上产生颗粒线基板的旋转对称轴,以及在径向方向上具有受控孔径比的孔径。;版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP2002285331A

    专利类型

  • 公开/公告日2002-10-03

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20010083094

  • 发明设计人 KAMITAKA NORIAKI;

    申请日2001-03-22

  • 分类号C23C14/54;G02B5/08;G02B5/28;

  • 国家 JP

  • 入库时间 2022-08-22 00:56:44

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