首页> 外国专利> Method of forming silicon-based thin film, silicon-based thin film, and photovoltaic element

Method of forming silicon-based thin film, silicon-based thin film, and photovoltaic element

机译:形成硅基薄膜的方法,硅基薄膜和光伏元件

摘要

A method of forming a silicon-based thin film according to the present invention comprises introducing a source gas containing silicon fluoride and hydrogen into a vacuum vessel, and using a high frequency plasma CVD method to form a silicon-based thin film on a substrate introduced into the vacuum vessel, wherein a luminous intensity attributed to SiFα (440 nm) is not smaller than a luminous intensity attributed to Hα (656 nm), thereby providing a photovoltaic element with excellent performance at a low cost as compared with a conventional one, a method of forming a silicon-based thin film with excellent characteristics in a short process cycle time at a further increased film-forming rate, a silicon-based thin film formed by the method, and a photovoltaic element comprising the silicon-based thin film with excellent characteristics, adhesion, and resistance to the environments.
机译:根据本发明的形成硅基薄膜的方法包括:将包含氟化硅和氢的原料气体引入真空容器中;以及使用高频等离子体CVD方法在引入的衬底上形成硅基薄膜。进入真空容器,其中归因于SiFα(440 nm)的发光强度不小于归因于Hα(656 nm)的发光强度,从而提供一种光电元件,与常规元件相比,其成本低廉,一种在短的加工周期时间内以进一步提高的成膜速率形成特性优异的硅基薄膜的方法,通过该方法形成的硅基薄膜以及包括该硅基薄膜的光电元件具有优异的特性,附着力和对环境的抵抗力。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号